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Inhalt des Dokuments

Publications in Proceedings 2006-2010

Local estimation of lattice parameters

T. Niermann, D. Plüschke, J.-B. Park, M. Lehmann
Local estimation of lattice parameters
W. Grogger, F. Hofer, P. Pölt (Eds.), MC2009, Vol. 3, S. 47

Electrostatic potential distribution on pn junction GaN-semiconductor

J. B. Park, T. Niermann, A. Knauer, M. Weyers, M. Kneissl, M. Lehmann
Electrostatic potential distribution on pn junction GaN-semiconductor
W. Grogger, F. Hofer, P. Pölt (Eds.), MC2009, Vol. 3, S. 33

Characterization and comparison of InAs quantum dashes uncapped and capped by InGaAsP layer

D. Plüschke, T. Niermann, D. Franke, M. Lehmann
Characterization and comparison of InAs quantum dashes uncapped and capped by InGaAsP layer
W. Grogger, F. Hofer, P. Pölt (Eds.), MC2009, Vol. 3, S. 41

Atomic Resolution Electron Holography Performance of a Titan TEM with High-Brightness Electron Gun

M. Lehmann, M. Linck, B. Freitag, S. Kujawa, T. Niermann
Atomic Resolution Electron Holography Performance of a Titan TEM with High-Brightness Electron Gun
G. Kothleitner, M. Leisch (Eds.), MC2009, Vol. 1, S. 39

Applied wave optics on the atomic scale: Electron holography materials characterization in a Titan TEM

 M. Linck, M. Lehmann, B. Freitag, S. Kujawa, T. Niermann
Applied wave optics on the atomic scale: Electron holography materials characterization in a Titan TEM
G. Kothleitner, M. Leisch (Eds.), MC2009, Vol. 1, S. 17

Imaging of InAs/GaAs Submonolayers by Cs-Corrected HRTEM

T. Niermann, K. Pötschke, U. W. Pohl, D. Bimberg, M. Lehmann
Imaging of InAs/GaAs Submonolayers by Cs-Corrected HRTEM
2009 International Nano-Optoelectronics Workshop (iNOW2009)

TEM - Investigations of capped InAs quantum dashes

D. Plüschke, T. Niermann, D. Franke, M. Lehmann
TEM - Investigations of capped InAs quantum dashes
2009 International Nano-Optoelectronics Workshop (iNOW2009)

Mapping the electrostatic potential of a GaN pn-junction using off-axis electron holography

J. B. Park, T. Niermann, A. Knauer,  M. Weyers, M. Kneissl, M. Lehmann
Mapping the electrostatic potential of a GaN pn-junction using off-axis electron holography
2009 International Nano-Optoelectronics Workshop (iNOW2009)

Aberration Correction and Electron Holography

Hannes Lichte, Dorin Geiger, Martin Linck, Michael Lehmann
Aberration Correction and Electron Holography
Microsc Microanal 15 (Suppl 2), 2009, 1460-1461

Characterization of the holography performance of a Titan 80-300 with high brightness Schottky electron gun and image Cs-corrector at 300 kV acceleration

Bert Freitag, Stephan Kujawa, Martin Linck, Dorin Geiger, Tore Niermann, Michael Lehmann, Hannes Lichte:
Characterization of the holography performance of a Titan 80-300 with high brightness Schottky electron gun and image Cs-corrector at 300 kV acceleration
Microsc Microanal 15 (Suppl 2), 2009, 1098-1099

Electron Holography with Cs-corrected Tecnai F20 - elimination of the incoherent damping introduced by the biprism in conventional electron microscopes

Dorin Geiger, Axel Rother, Martin Linck, Hannes Lichte, Michael Lehmann, Max Haider, Bert Freitag
Electron Holography with Cs-corrected Tecnai F20 - elimination of the incoherent damping introduced by the biprism in conventional electron microscopes
Proc. EMC2008 (2008) 255-256

Off-axis Electron Holography: Beyond Atomic Structure Determination

Michael Lehmann
Off-axis Electron Holography: Beyond Atomic Structure Determination
Abstracts E-MRS 2007 Fall Meeting (2007) 253

Improved Performance of Electron Holography with Tecnai F20 Cs-corr

Dorin Geiger, Hannes Lichte, Martin Linck, Michael Lehmann, Bert Freitag, Maximilian Haider
Improved Performance of Electron Holography with Tecnai F20 Cs-corr
Microscopy and Microanalysis 13 (Supplement 3) (2007) 36-37

Search for Ferroelectric Stray Fields around Ferroelectric Nanoparticles by Means of HRTEM and Electron Holography

Margarita Weiß, Hannes Lichte, Gil Markovich, Tcipi Fried, Sebastian Wohlrab, Michael Lehmann
Search for Ferroelectric Stray Fields around Ferroelectric Nanoparticles by Means of HRTEM and Electron Holography
Microscopy and Microanalysis 13 (Supplement 3) (2007) 276-277

Off-Axis Electron Holography: Progress into Application

M. Linck, H. Lichte, M. Lehmann, P. Formanek, D. Geiger, K. Vogel, A. Lenk, Ch. Matzeck, D. Wolf, A. Rother, F. Röder, M. Reibold, B. Einenkel
Off-Axis Electron Holography: Progress into Application
41st Annual Scientific Meeting of Israel Society for Microscopy (2007)

Characterisation of Ferroelectric Nanoparticles by HRTEM and Electron Holography

M. Weiß, H. Lichte, G. Markovich, T. Fried, S. Wohlrab, M. Lehmann
Characterisation of Ferroelectric Nanoparticles by HRTEM and Electron Holography
Proc. DPG 2007, Regensburg, Germany

Electron Holography using Aberration Corrected TEM: Towards the Frontiers of Materials Characterization

M. Lehmann
Electron Holography using Aberration Corrected TEM: Towards the Frontiers of Materials Characterization
in: Knut Urban, Claus M. Schneider, Thomas Brückel, Stefan Blügel, Karsten Tillmann, Werner Schweika, Markus Lentzen, Lutz Baumgarten (Eds.): Probing the Nanoworld - Microscopies, Scattering and Spectroscopies of the Solid State, Schriften des Forschungszentrums Jülich, Reihe Materie und Material / Matter and Materials, Band / Volume 34 (2007) C3.1-C3.17
ISBN 978-3-89336-462-6

Argand-Plots of Holographic Exit-Waves for Measurement of Specimen Thickness at Single Atomic Columns

M. Lehmann
Argand-Plots of Holographic Exit-Waves for Measurement of Specimen Thickness at Single Atomic Columns
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 724

Electron Holography with Cs-corrected TEM at the Triebenberg Laboratory

D. Geiger, H. Lichte, M. Lehmann, B. Freitag, M. Haider
Electron Holography with Cs-corrected TEM at the Triebenberg Laboratory
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 731

Investigation of the Influence of Inelastically Scattered Electrons on HRTEM images using Electron Holography

D. Wolf, M. Lehmann, H. Lichte, D. Geiger, A. Rother
Investigation of the Influence of Inelastically Scattered Electrons on HRTEM images using Electron Holography
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 735

Electron holography: atomic resolution materials analysis

M. Linck, H. Lichte, M. Lehmann
Electron holography: atomic resolution materials analysis
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 736

Ruddlesden-Popper phases in SrTiO3

M. Reibold, M. Lehmann, D.C. Meyer, A.A. Levin, T. Leisegang, E. Gutmann, P. Paufler
Ruddlesden-Popper phases in SrTiO3
Proc. IMC16, Sapporo, Japan, Vol. 3 (2006) 1386

Cs-Correction and Electron Holography: Exciting TEM-Methods for Solving Nanoquestions

M. Lehmann
Cs-Correction and Electron Holography: Exciting TEM-Methods for Solving Nanoquestions
Proc. ECM23, Leuven, Belgium, Acta Cryst. A62 (2006) s50

Electron Holography - New Possibilities for Materials Characterization with subnanometer Resolution

M. Lehmann
Electron Holography - New Possibilities for Materials Characterization with (sub‑)nanometer Resolution
Proc. DPG 2006, Dresden, Germany

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Prof. Dr. Michael Lehmann
+49 (0)30-314 22567
Ernst-Ruska-Gebäude
Raum ER 292

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Elke Wandke
+49 (0)30-314 23585
Ernst-Ruska-Gebäude
Raum ER 290

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