Inhalt des Dokuments
Modern electron microscopy is a very broad field with lots of different instruments and a large variety of powerful methods. Our workgroup concentrates on the further development of off-axis electron holography in a transmission electron microscope (TEM) towards a full quantitative method for measurements of electrostatic potentials in nanostructures and devices as well as the utilization of the fully reconstructed and corrected object exit-wave up to the ultimate information limit of the instrument. We apply our methods like e.g. aberration-corrected high-resolution TEM (HRTEM), off-axis electron holography, and dark-field electron holography mainly for investigations of semiconductor systems tackling important scientific questions from material sciences and solid state physics. Since this cutting-edge research requires the highest level of instrumental and environmental stability, ZELMI's and ours four most sensitive and most powerful instruments are located in an extra building, which has been specially designed only for the needs of advanced electron microscopy.
For more details of our research, please follow these links:
- Research || Instrumentation and Methods 
- Research || Applications 
- Instrumentation in Building TEM 
- Publications 
If you are looking for an interesting and challenging qualification work (Bachelor and Master thesis) deeply involved in current research by our group, please follow this link ….
Our research is financially supported through the following funding agencies and projects, respectively:
+49 (0)30-314 22567
Raum ER 292
+49 (0)30-314 23585
Raum ER 290