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Publications in Proceedings

Electron holography for characterization of semiconductor structures down to the atomic scale

M. Lehmann, F. Genz, U. Hömpler, F. Kießling, T. Niermann, J. B. Park Electron holography for characterization of semiconductor structures down to the atomic scale invited by MC2013 Regensburg

Averaging scheme for the reconstruction of atomic resolution off-axis electron holograms

T. Niermann, M. Lehmann Averaging scheme for the reconstruction of atomic resolution off-axis electron holograms accepted by MC2013 Regensburg

The Influence of the Electron Beam on Potentiometry of GaN

J.B. Park, T. Niermann, M. Beleggia and M. Lehmann The Influence of the Electron Beam on Potentiometry of GaN accepted by MC2013 Regensburg

Comparison of 2- and 3-Condenser Illumination in Off-axis Electron Holography

F. Genz, T. Niermann and M. Lehmann Comparison of 2- and 3-Condenser Illumination in Off-axis Electron Holography accepted by MC2013 Regensburg

Strain analysis of buried AlAs/oxide stressor layers by dark field holography

F. Kießling, T. Niermann, J.-H. schulze, A. Strittmatter, U. W. Pohl and M. Lehmann Strain analysis of buried AlAs/oxide stressor layers by dark field holography accepted by MC2013 Regensburg

Optimization and characterisation of metamorphic buffer layers for extended-InGaAs/InP photodetectors

S. Seifert, D. Franke, D. Zengler, F. Kießling, M. Lehmann Optimization and characterisation of metamorphic buffer layers for extended-InGaAs/InP photodetectors accepted by MC2013 Regensburg

Recent progress of high-resolution off-axis electron holography

T. Niermann, M. Lehmann Recent progress of high-resolution off-axis electron holography Proc. EMC2012 (2012)

Built-in potentials in GaN p-n junctions measured by electron holography

J. B. Park, T. Niermann, M. Lehmann Built-in potentials in GaN p-n junctions measured by electron holography Proc. EMC2012 (2012)

Optimized conditions for high-resolution double-biprism holography

F. Genz, T. Niermann, B. Buijsse, B. Freitag, M. Lehmann Optimized conditions for high-resolution double-biprism holography Proc. EMC2012 (2012)

(HR)TEM-investigations of GaN/Sc2O3 /Y2O3 /Si(111) heterostructure

D. Zengler, L. Tarnawska, T. Schroeder, T. Niermann, M. Lehmann (HR)TEM-investigations of GaN/Sc₂O₃ /Y₂O₃ /Si(111) heterostructure Proc. EMC2012 (2012)

HRTEM composition measurements of InAs/GaAs submonolayer depostions

F. Kießling, T. Niermann, J.-H. Schulze, T. D. Germann, A. Strittmatter, U.W. Pohl, D. Bimberg, M. Lehmann HRTEM composition measurements of InAs/GaAs submonolayer depostions Proc. EMC2012 (2012)

On detector noise

T. Niermann, A. Lubk, F. Röder
On detector noise
Proc. MC2011 (2011), Vol. 1

Quantitative analysis of electrostatic potentials in GaN pn-junctions using off-axis electron holography

J. B. Park, T. Niermann, A. Knauer, M. Weyers, M. Kneissl, M. Lehmann
Quantitative analysis of electrostatic potentials in GaN pn-junctions using off-axis electron holography
Proc. MC2011 (2011), Vol. 3

Double-biprism holography in an 80-300 kV transmission electron microscope

F. Genz, T. Niermann, B. Buijsse, B. Freitag, M. Lehmann
Double-biprism holography in an 80-300 kV transmission electron microscope
Proc. MC2011 (2011), Vol. 1

TEM investigations of GaN/Sc2O3/Y2O3/Si(111)

D. Albrecht, L. Tarnawska, T. Schröder, T. Niermann, M. Lehmann
TEM investigations of GaN/Sc₂O₃ /Y₂O₃ /Si(111)
Proc. MC2011 (2011), Vol. 3

Lorentz microscopy and off-axis electron holography on Co/Pt-multilayer magnetic films

S. Frömmel, T. Niermann, M. Lehmann
Lorentz microscopy and off-axis electron holography on Co/Pt-multilayer magnetic films
Proc. MC2011 (2011), Vol. 1

Local estimation of lattice parameters

T. Niermann, D. Plüschke, J.-B. Park, M. Lehmann
Local estimation of lattice parameters
W. Grogger, F. Hofer, P. Pölt (Eds.), MC2009, Vol. 3, S. 47

Electrostatic potential distribution on pn junction GaN-semiconductor

J. B. Park, T. Niermann, A. Knauer, M. Weyers, M. Kneissl, M. Lehmann
Electrostatic potential distribution on pn junction GaN-semiconductor
W. Grogger, F. Hofer, P. Pölt (Eds.), MC2009, Vol. 3, S. 33

Characterization and comparison of InAs quantum dashes uncapped and capped by InGaAsP layer

D. Plüschke, T. Niermann, D. Franke, M. Lehmann
Characterization and comparison of InAs quantum dashes uncapped and capped by InGaAsP layer
W. Grogger, F. Hofer, P. Pölt (Eds.), MC2009, Vol. 3, S. 41

Atomic Resolution Electron Holography Performance of a Titan TEM with High-Brightness Electron Gun

M. Lehmann, M. Linck, B. Freitag, S. Kujawa, T. Niermann
Atomic Resolution Electron Holography Performance of a Titan TEM with High-Brightness Electron Gun
G. Kothleitner, M. Leisch (Eds.), MC2009, Vol. 1, S. 39

Applied wave optics on the atomic scale: Electron holography materials characterization in a Titan TEM

M. Linck, M. Lehmann, B. Freitag, S. Kujawa, T. Niermann
Applied wave optics on the atomic scale: Electron holography materials characterization in a Titan TEM
G. Kothleitner, M. Leisch (Eds.), MC2009, Vol. 1, S. 17

Imaging of InAs/GaAs Submonolayers by Cs-Corrected HRTEM

T. Niermann, K. Pötschke, U. W. Pohl, D. Bimberg, M. Lehmann
Imaging of InAs/GaAs Submonolayers by Cs-Corrected HRTEM
2009 International Nano-Optoelectronics Workshop (iNOW2009)

TEM - Investigations of capped InAs quantum dashes

D. Plüschke, T. Niermann, D. Franke, M. Lehmann
TEM - Investigations of capped InAs quantum dashes
2009 International Nano-Optoelectronics Workshop (iNOW2009)

Mapping the electrostatic potential of a GaN pn-junction using off-axis electron holography

J. B. Park, T. Niermann, A. Knauer, M. Weyers, M. Kneissl, M. Lehmann
Mapping the electrostatic potential of a GaN pn-junction using off-axis electron holography
2009 International Nano-Optoelectronics Workshop (iNOW2009)

Aberration Correction and Electron Holography

Hannes Lichte, Dorin Geiger, Martin Linck, Michael Lehmann
Aberration Correction and Electron Holography
Microsc Microanal 15 (Suppl 2), 2009, 1460-1461

Characterization of the holography performance of a Titan 80-300 with high brightness Schottky electron gun and image Cs-corrector at 300 kV acceleration

Bert Freitag, Stephan Kujawa, Martin Linck, Dorin Geiger, Tore Niermann, Michael Lehmann, Hannes Lichte:
Characterization of the holography performance of a Titan 80-300 with high brightness Schottky electron gun and image Cs-corrector at 300 kV acceleration
Microsc Microanal 15 (Suppl 2), 2009, 1098-1099

Electron Holography with Cs-corrected Tecnai F20 - elimination of the incoherent damping introduced by the biprism in conventional electron microscopes

Dorin Geiger, Axel Rother, Martin Linck, Hannes Lichte, Michael Lehmann, Max Haider, Bert Freitag
Electron Holography with Cs-corrected Tecnai F20 - elimination of the incoherent damping introduced by the biprism in conventional electron microscopes
Proc. EMC2008 (2008) 255-256

Off-axis Electron Holography: Beyond Atomic Structure Determination

Michael Lehmann
Off-axis Electron Holography: Beyond Atomic Structure Determination
Abstracts E-MRS 2007 Fall Meeting (2007) 253

Improved Performance of Electron Holography with Tecnai F20 Cs-corr

Dorin Geiger, Hannes Lichte, Martin Linck, Michael Lehmann, Bert Freitag, Maximilian Haider
Improved Performance of Electron Holography with Tecnai F20 Cs-corr
Microscopy and Microanalysis 13 (Supplement 3) (2007) 36-37

Search for Ferroelectric Stray Fields around Ferroelectric Nanoparticles by Means of HRTEM and Electron Holography

Margarita Weiß, Hannes Lichte, Gil Markovich, Tcipi Fried, Sebastian Wohlrab, Michael Lehmann
Search for Ferroelectric Stray Fields around Ferroelectric Nanoparticles by Means of HRTEM and Electron Holography
Microscopy and Microanalysis 13 (Supplement 3) (2007) 276-277

Off-Axis Electron Holography: Progress into Application

M. Linck, H. Lichte, M. Lehmann, P. Formanek, D. Geiger, K. Vogel, A. Lenk, Ch. Matzeck, D. Wolf, A. Rother, F. Röder, M. Reibold, B. Einenkel
Off-Axis Electron Holography: Progress into Application
41st Annual Scientific Meeting of Israel Society for Microscopy (2007)

Characterisation of Ferroelectric Nanoparticles by HRTEM and Electron Holography

M. Weiß, H. Lichte, G. Markovich, T. Fried, S. Wohlrab, M. Lehmann
Characterisation of Ferroelectric Nanoparticles by HRTEM and Electron Holography
Proc. DPG 2007, Regensburg, Germany

Electron Holography using Aberration Corrected TEM: Towards the Frontiers of Materials Characterization

M. Lehmann
Electron Holography using Aberration Corrected TEM: Towards the Frontiers of Materials Characterization
in: Knut Urban, Claus M. Schneider, Thomas Brückel, Stefan Blügel, Karsten Tillmann, Werner Schweika, Markus Lentzen, Lutz Baumgarten (Eds.): Probing the Nanoworld - Microscopies, Scattering and Spectroscopies of the Solid State, Schriften des Forschungszentrums Jülich, Reihe Materie und Material / Matter and Materials, Band / Volume 34 (2007) C3.1-C3.17
ISBN 978-3-89336-462-6

Argand-Plots of Holographic Exit-Waves for Measurement of Specimen Thickness at Single Atomic Columns

M. Lehmann
Argand-Plots of Holographic Exit-Waves for Measurement of Specimen Thickness at Single Atomic Columns
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 724

Electron Holography with Cs-corrected TEM at the Triebenberg Laboratory

D. Geiger, H. Lichte, M. Lehmann, B. Freitag, M. Haider
Electron Holography with Cs-corrected TEM at the Triebenberg Laboratory
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 731

Investigation of the Influence of Inelastically Scattered Electrons on HRTEM images using Electron Holography

D. Wolf, M. Lehmann, H. Lichte, D. Geiger, A. Rother
Investigation of the Influence of Inelastically Scattered Electrons on HRTEM images using Electron Holography
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 735

Electron holography: atomic resolution materials analysis

M. Linck, H. Lichte, M. Lehmann
Electron holography: atomic resolution materials analysis
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 736

Ruddlesden-Popper phases in SrTiO3

M. Reibold, M. Lehmann, D.C. Meyer, A.A. Levin, T. Leisegang, E. Gutmann, P. Paufler
Ruddlesden-Popper phases in SrTiO₃
Proc. IMC16, Sapporo, Japan, Vol. 3 (2006) 1386

Cs-Correction and Electron Holography: Exciting TEM-Methods for Solving Nanoquestions

M. Lehmann
Cs-Correction and Electron Holography: Exciting TEM-Methods for Solving Nanoquestions
Proc. ECM23, Leuven, Belgium, Acta Cryst. A62 (2006) s50

Electron Holography - New Possibilities for Materials Characterization with subnanometer Resolution

M. Lehmann
Electron Holography - New Possibilities for Materials Characterization with (sub‑)nanometer Resolution
Proc. DPG 2006, Dresden, Germany

1992-2005

M. Lehmann
Electron Holography for Quantitative Measurements at Atomic Dimensions
Proc. Microscopy Conference MC2005, Davos, Switzerland
M. Lehmann
Electron Holography on the Way to Measuring the Weight of Atomic Columns with Single Atom Sensitivity
Proc. Microscopy Conference MC2005, Davos, Switzerland
D. Wolf, M. Lehmann, H. Lichte
Quantitative Comparison of Sideband and Centerband in Electron Holography
Proc. Microscopy Conference MC2005, Davos, Switzerland
M. Linck, M. Lehmann, H. Lichte
Electron Holographic Materials Analysis at Atomic Resolution
Proc. Microscopy Conference MC2005, Davos, Switzerland
D. Geiger, H. Lichte, M. Lehmann, B. Freitag, M. Haider
Electron Holography with a Cs-corrected TEM at Triebenberg Laboratory: Present state
Proc. Microscopy Conference MC2005, Davos, Switzerland
M. Lehmann, D. Geiger, H. Lichte
First Experiences using Electron Holography with Cs-corrected TEM
Microsc. Microanal. 11 (Suppl 2: Proceedings), Honolulu (2005) 2146-2147
M. Lehmann
Residual Crystal Tilt Analysis using High-Resolution Electron Holography
Microsc. Microanal. 10 (Suppl 2: Proceedings), Savannah (2004) 984CD - 985CD
H. Lichte, D. Geiger, M. Lehmann, M. Haider, B. Freitag
Electron Holography with Cs-corrected TEM
Microsc. Microanal. 10 (Suppl 2: Proceedings), Savannah (2004) 112 - 113
M. Lehmann
Quantitative evaluation of off-axis electron holograms with atomic resolution
Proc. EMC2004 Antwerp, Vol. I, 183-184
H. Lichte, M. Reibold, K. Vogel, M. Lehmann, D. Geiger, R. Goldberg
Atomic Dipols in Ferroelectrics by means of Electron Holography
Proc. EMC2004, Antwerp, Vol. II, 491-492
D. Wolf, M. Lehmann, D. Geiger, H. Lichte
Simulation of quantum noise and application in electron holography
Proc. EMC2004, Antwerp, Vol. I, 199-200
D. Geiger, H. Lichte, M. Lehmann, M. Haider, B. Freitag
Electron Holography with Cs-corrected TEM
Proc. EMC2004, Antwerp, Vol. I, 187-188
H. Lichte, M. Reibold, K. Vogel, M. Lehmann
Ferroelectric Holography
Microsc. Microanal. 9 (Suppl 3: Proceedings), Dresden (2003) 258 - 259
M. Lehmann, H. Lichte
Is there a Stobbs-Factor in Off-axis Electron Holography?
Microsc. Microanal. 9 (Suppl 3: Proceedings), Dresden (2003) 46 - 47
D. Geiger, H. Lichte, M. Lehmann
Solving the Inverse Problem: a "brute force" method
Microsc. Microanal. 9 (Suppl 3: Proceedings), Dresden (2003) 42 - 43
H. Lichte, M. Lehmann
Electron Holography
Microsc. Microanal. 9 (Suppl 3: Proceedings), Dresden (2003) 14 - 15
M. Lehmann
Exit-Surface Dependency of Defocus measured by Off-axis Electron Holography
Microsc. Microanal. 9 (Suppl 2: Proceedings), San Antonio (2003) 786 - 787
U. Mühle, A. Lenk, M. Lehmann, H. Lichte
Visualisation of Electrically Active Areas Using Electron Holography
Conference Proceedings from the 28th International Symposium for Testing and Failure Analysis (ISTFA) (2002) 39-46
M. Lehmann, D. Geiger, I. Büscher, H.W. Zandbergen, D. Van Dyck, H. Lichte
Quantitative Analysis of Focal-Series of Off-axis Electron Holograms
Proc. 15^th Int. Congr. on Electron Microscopy ICEM15, Durban, South Africa, Vol. 3 (2002) 279 – 280
K. Brand, M. Lehmann, A. Lenk, H. Lichte, H.-J. Engelmann, U. Mühle
Dopant Profiling in Semiconductor Devices using Electron Holography - Influence of Specimen Orientation
Proc. 15^th Int. Congr. on Electron Microscopy ICEM15, Durban, South Africa, Vol. 1 (2002) 37 – 38
I. Buscher, J. Jansen, H.W. Zandbergen, M. Lehmann
Comparison of the Reconstructed Exit Wave and Electron Diffraction Data taken from the same Area
Proc. 15^th Int. Congr. on Electron Microscopy ICEM15, Durban, South Africa, Vol. 3 (2002) 209 – 210
M. Lehmann, K. Brand, H. Lichte
Holographic Setup for 2D-Dopant Profiling using the Lorentz-Lens
Microsc. Microanal. 8 (Suppl 2: Proceedings), Quebec (2002) 536CD – 537CD
M. Lehmann, H. Lichte
Contributions of Elastically and Inelastically Scattered Electrons to High-Resolution Off-Axis Electron Holograms – a Quantitative Analysis
Microsc. Microanal. 8 (Suppl 2: Proceedings), Quebec (2002) 34 - 35
H. Lichte, M. Reibold, K. Brand, M. Lehmann
Ferroelectric Electron Holography
Microsc. Microanal. 8 (Suppl 2: Proceedings), Quebec (2002) 538CD – 539CD
H. Lichte, D. Schulze, M. Lehmann, H. Just, T. Erabi, P. Fuerst, J. Goebel, A. Hasenpusch, P. Dietz
The Triebenberg Laboratory - Designed for Highest Resolution Electron Microscopy and Holography
Microsc. Microanal. 7 (Suppl 2: Proceedings), Long Beach (2001) 894 – 895
K. Brand, Ch. Guo, M. Lehmann, H. Lichte
Quantitative Electron Holography - from the Basis of Dynamical Interaction to Holographic Materials Analysis
Microsc. Microanal. 7 (Suppl 2: Proceedings), Long Beach (2001) 284 – 285
K. Brand, M. Lehmann, T. Walter, K. Dörr
TEM Investigation of Manganite Thin Films on Different Substrates
Proc. 12^th European Congress on Electron Microscopy EUREM 2000, Brno (Czech Republic), Volume II, (2000) P 207 - P 208
M. Lehmann, T. Walter, K. Dörr
Holographic Studies of Thin Manganite Films
Proc. 12^th European Congress on Electron Microscopy EUREM 2000, Brno (Czech Republic), Volume III, (2000) I 67 - I 68
H. Lichte, M. Lehmann
Off-axis Electron Holography – The Way to Use
Proc. 12^th European Congress on Electron Microscopy EUREM 2000, Brno (Czech Republic), Volume III, (2000) I 47 - I 48
H. Lichte, D. Schulze, M. Lehmann, H. Just, T. Erabi, P. Fürst, J. Göbel, A. Hasenpusch, P. Dietz
The Triebenberg Laboratory – designed for highest resolution electron microscopy and holography
Proc. 12^th European Congress on Electron Microscopy EUREM 2000, Brno (Czech Republic), Volume III (2000) I 163 - I 164
A.C. Twitchett, S.J. Lloyd, M. Lehmann, P.A. Midgley
Two-dimensional mapping of electrostatic potential in a SiC MESFET using electron holography
Proc.12^th European Congress on Electron Microscopy EUREM 2000, Brno (Czech Republic), Volume III, (2000) I 73 - I 74
H. Lichte, D. Schulze, M. Lehmann
Das Triebenberg-Laboratorium für Höchstauflösungselektronenmikroskopie und elektronenoptische Holographie an der Technischen Universität Dresden
Wissenschaftliche Zeitschrift der Universität Dresden 49 (2000) Heft 1, 62 - 65
M. Lehmann:
Determination and correction of coherent wave aberration from off-axis electron holograms by means of a Genetic algorithm
Proceedings of the 14^th International Congress on Electron Microscopy ICEM14, Cancun (Mexico), Volume I, (1998) 557 - 558
M. Lehmann
Electron holography at atomic dimensions- state of the art in Tübingen
Proceedings of the 11^th European Congress on Electron Microscopy EUREM11, Dublin (Ireland), Volume 1, (1996) 386 - 387
H. Lichte, D. Geiger, A. Harscher, E. Heindl, M. Lehmann, D. Malamidis, A. Orchowski, W.‑D. Rau
Artefacts in electron holography
Proceedings of the 11^th European Congress on Electron Microscopy EUREM11, Dublin (Ireland), Volume 1, (1996) 402 - 403
E. Völkl, L.F. Allard, T.A. Nolan, D. Hill, M. Lehmann
A simple and inexpensive route to remote electron microscopy
Conf. Proc. Microscopy and Microanalysis (1996)
M. Lehmann, H. Lichte
Interactive computerbased holographic correction of aberrations
13^thInternational Congress on Electron Microscopy, ICEM13, Paris, (1994) 293 - 294
M. Lehmann, F. Lenz, E. Völkl, H. Lichte
A fast alternative algorithm for the reconstruction of electron off-axis holograms
10^th European Congress on Electron Microscopy, EUREM92, Granada, Last Minute Brochure (1992) 21 - 22

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Prof. Dr. Michael Lehmann
+49 (0)30-314 22567
Ernst-Ruska-Gebäude
Room ER 292
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Elke Wandke
+49 (0)30-314 23585
Ernst-Ruska-Gebäude
Room ER 290
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