Inhalt des Dokuments
Electron holography for characterization of semiconductor structures down to the atomic scale
Averaging scheme for the reconstruction of atomic resolution off-axis electron holograms
T. Niermann, M. Lehmann Averaging scheme for the reconstruction of atomic resolution off-axis electron holograms accepted by MC2013 Regensburg
The Influence of the Electron Beam on Potentiometry of GaN
J.B. Park, T. Niermann, M. Beleggia and M. Lehmann The Influence of the Electron Beam on Potentiometry of GaN accepted by MC2013 Regensburg
Comparison of 2- and 3-Condenser Illumination in Off-axis Electron Holography
F. Genz, T. Niermann and M. Lehmann Comparison of 2- and 3-Condenser Illumination in Off-axis Electron Holography accepted by MC2013 Regensburg
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