T. Niermann, D. Plüschke, J.-B. Park, M. Lehmann
Local estimation of lattice parameters
W. Grogger, F. Hofer, P. Pölt (Eds.), MC2009, Vol. 3, S. 47

J. B. Park, T. Niermann, A. Knauer, M. Weyers, M. Kneissl, M. Lehmann
Electrostatic potential distribution on pn junction GaN-semiconductor
W. Grogger, F. Hofer, P. Pölt (Eds.), MC2009, Vol. 3, S. 33

D. Plüschke, T. Niermann, D. Franke, M. Lehmann
Characterization and comparison of InAs quantum dashes uncapped and capped by InGaAsP layer
W. Grogger, F. Hofer, P. Pölt (Eds.), MC2009, Vol. 3, S. 41

M. Lehmann, M. Linck, B. Freitag, S. Kujawa, T. Niermann
Atomic Resolution Electron Holography Performance of a Titan TEM with High-Brightness Electron Gun
G. Kothleitner, M. Leisch (Eds.), MC2009, Vol. 1, S. 39

 M. Linck, M. Lehmann, B. Freitag, S. Kujawa, T. Niermann
Applied wave optics on the atomic scale: Electron holography materials characterization in a Titan TEM
G. Kothleitner, M. Leisch (Eds.), MC2009, Vol. 1, S. 17

T. Niermann, K. Pötschke, U. W. Pohl, D. Bimberg, M. Lehmann
Imaging of InAs/GaAs Submonolayers by Cs-Corrected HRTEM
2009 International Nano-Optoelectronics Workshop (iNOW2009)

D. Plüschke, T. Niermann, D. Franke, M. Lehmann
TEM - Investigations of capped InAs quantum dashes
2009 International Nano-Optoelectronics Workshop (iNOW2009)

J. B. Park, T. Niermann, A. Knauer,  M. Weyers, M. Kneissl, M. Lehmann
Mapping the electrostatic potential of a GaN pn-junction using off-axis electron holography
2009 International Nano-Optoelectronics Workshop (iNOW2009)

Hannes Lichte, Dorin Geiger, Martin Linck, Michael Lehmann
Aberration Correction and Electron Holography
Microsc Microanal 15 (Suppl 2), 2009, 1460-1461

Bert Freitag, Stephan Kujawa, Martin Linck, Dorin Geiger, Tore Niermann, Michael Lehmann, Hannes Lichte:
Characterization of the holography performance of a Titan 80-300 with high brightness Schottky electron gun and image Cs-corrector at 300 kV acceleration
Microsc Microanal 15 (Suppl 2), 2009, 1098-1099

Dorin Geiger, Axel Rother, Martin Linck, Hannes Lichte, Michael Lehmann, Max Haider, Bert Freitag
Electron Holography with Cs-corrected Tecnai F20 - elimination of the incoherent damping introduced by the biprism in conventional electron microscopes
Proc. EMC2008 (2008) 255-256

Michael Lehmann
Off-axis Electron Holography: Beyond Atomic Structure Determination
Abstracts E-MRS 2007 Fall Meeting (2007) 253

Dorin Geiger, Hannes Lichte, Martin Linck, Michael Lehmann, Bert Freitag, Maximilian Haider
Improved Performance of Electron Holography with Tecnai F20 Cs-corr
Microscopy and Microanalysis 13 (Supplement 3) (2007) 36-37

Margarita Weiß, Hannes Lichte, Gil Markovich, Tcipi Fried, Sebastian Wohlrab, Michael Lehmann
Search for Ferroelectric Stray Fields around Ferroelectric Nanoparticles by Means of HRTEM and Electron Holography
Microscopy and Microanalysis 13 (Supplement 3) (2007) 276-277

M. Linck, H. Lichte, M. Lehmann, P. Formanek, D. Geiger, K. Vogel, A. Lenk, Ch. Matzeck, D. Wolf, A. Rother, F. Röder, M. Reibold, B. Einenkel
Off-Axis Electron Holography: Progress into Application
41st Annual Scientific Meeting of Israel Society for Microscopy (2007)

M. Weiß, H. Lichte, G. Markovich, T. Fried, S. Wohlrab, M. Lehmann
Characterisation of Ferroelectric Nanoparticles by HRTEM and Electron Holography
Proc. DPG 2007, Regensburg, Germany

M. Lehmann
Electron Holography using Aberration Corrected TEM: Towards the Frontiers of Materials Characterization
in: Knut Urban, Claus M. Schneider, Thomas Brückel, Stefan Blügel, Karsten Tillmann, Werner Schweika, Markus Lentzen, Lutz Baumgarten (Eds.): Probing the Nanoworld - Microscopies, Scattering and Spectroscopies of the Solid State, Schriften des Forschungszentrums Jülich, Reihe Materie und Material / Matter and Materials, Band / Volume 34 (2007) C3.1-C3.17
ISBN 978-3-89336-462-6

M. Lehmann
Argand-Plots of Holographic Exit-Waves for Measurement of Specimen Thickness at Single Atomic Columns
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 724

D. Geiger, H. Lichte, M. Lehmann, B. Freitag, M. Haider
Electron Holography with Cs-corrected TEM at the Triebenberg Laboratory
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 731

D. Wolf, M. Lehmann, H. Lichte, D. Geiger, A. Rother
Investigation of the Influence of Inelastically Scattered Electrons on HRTEM images using Electron Holography
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 735

M. Linck, H. Lichte, M. Lehmann
Electron holography: atomic resolution materials analysis
Proc. IMC16, Sapporo, Japan, Vol. 2 (2006) 736

M. Reibold, M. Lehmann, D.C. Meyer, A.A. Levin, T. Leisegang, E. Gutmann, P. Paufler
Ruddlesden-Popper phases in SrTiO₃
Proc. IMC16, Sapporo, Japan, Vol. 3 (2006) 1386

M. Lehmann
Cs-Correction and Electron Holography: Exciting TEM-Methods for Solving Nanoquestions
Proc. ECM23, Leuven, Belgium, Acta Cryst. A62 (2006) s50

M. Lehmann
Electron Holography - New Possibilities for Materials Characterization with (sub‑)nanometer Resolution
Proc. DPG 2006, Dresden, Germany