Inhalt des Dokuments
Publications in Proceedings 1992-2005
- M. Lehmann
Electron Holography for Quantitative Measurements at Atomic Dimensions
Proc. Microscopy Conference MC2005, Davos, Switzerland - M. Lehmann
Electron Holography on the Way to Measuring the Weight of Atomic Columns with Single Atom Sensitivity
Proc. Microscopy Conference MC2005, Davos, Switzerland - D. Wolf, M. Lehmann, H. Lichte
Quantitative Comparison of Sideband and Centerband in Electron Holography
Proc. Microscopy Conference MC2005, Davos, Switzerland - M. Linck, M. Lehmann, H. Lichte
Electron Holographic Materials Analysis at Atomic Resolution
Proc. Microscopy Conference MC2005, Davos, Switzerland - D. Geiger, H. Lichte, M. Lehmann, B. Freitag, M. Haider
Electron Holography with a Cs-corrected TEM at Triebenberg Laboratory: Present state
Proc. Microscopy Conference MC2005, Davos, Switzerland - M. Lehmann, D. Geiger, H. Lichte
First Experiences using Electron Holography with Cs-corrected TEM
Microsc. Microanal. 11 (Suppl 2: Proceedings), Honolulu (2005) 2146-2147 - M. Lehmann
Residual Crystal Tilt Analysis using High-Resolution Electron Holography
Microsc. Microanal. 10 (Suppl 2: Proceedings), Savannah (2004) 984CD - 985CD - H. Lichte, D. Geiger, M. Lehmann, M. Haider, B. Freitag
Electron Holography with Cs-corrected TEM
Microsc. Microanal. 10 (Suppl 2: Proceedings), Savannah (2004) 112 - 113 - M. Lehmann
Quantitative evaluation of off-axis electron holograms with atomic resolution
Proc. EMC2004 Antwerp, Vol. I, 183-184 - H. Lichte, M. Reibold, K. Vogel, M. Lehmann, D. Geiger, R. Goldberg
Atomic Dipols in Ferroelectrics by means of Electron Holography
Proc. EMC2004, Antwerp, Vol. II, 491-492 - D. Wolf, M. Lehmann, D. Geiger, H. Lichte
Simulation of quantum noise and application in electron holography
Proc. EMC2004, Antwerp, Vol. I, 199-200 - D. Geiger, H. Lichte, M. Lehmann, M. Haider, B. Freitag
Electron Holography with Cs-corrected TEM
Proc. EMC2004, Antwerp, Vol. I, 187-188 - H. Lichte, M. Reibold, K. Vogel, M. Lehmann
Ferroelectric Holography
Microsc. Microanal. 9 (Suppl 3: Proceedings), Dresden (2003) 258 - 259 - M. Lehmann, H. Lichte
Is there a Stobbs-Factor in Off-axis Electron Holography?
Microsc. Microanal. 9 (Suppl 3: Proceedings), Dresden (2003) 46 - 47 - D. Geiger, H. Lichte, M. Lehmann
Solving the Inverse Problem: a "brute force" method
Microsc. Microanal. 9 (Suppl 3: Proceedings), Dresden (2003) 42 - 43 - H. Lichte, M. Lehmann
Electron Holography
Microsc. Microanal. 9 (Suppl 3: Proceedings), Dresden (2003) 14 - 15 - M. Lehmann
Exit-Surface Dependency of Defocus measured by Off-axis Electron Holography
Microsc. Microanal. 9 (Suppl 2: Proceedings), San Antonio (2003) 786 - 787 - U. Mühle, A. Lenk, M. Lehmann, H. Lichte
Visualisation of Electrically Active Areas Using Electron Holography
Conference Proceedings from the 28th International Symposium for Testing and Failure Analysis (ISTFA) (2002) 39-46 - M. Lehmann, D. Geiger, I. Büscher, H.W. Zandbergen, D. Van Dyck, H. Lichte
Quantitative Analysis of Focal-Series of Off-axis Electron Holograms
Proc. 15th Int. Congr. on Electron Microscopy ICEM15, Durban, South Africa, Vol. 3 (2002) 279 – 280 - K. Brand, M. Lehmann, A. Lenk, H. Lichte, H.-J. Engelmann, U. Mühle
Dopant Profiling in Semiconductor Devices using Electron Holography - Influence of Specimen Orientation
Proc. 15th Int. Congr. on Electron Microscopy ICEM15, Durban, South Africa, Vol. 1 (2002) 37 – 38 - I. Buscher, J. Jansen, H.W. Zandbergen, M. Lehmann
Comparison of the Reconstructed Exit Wave and Electron Diffraction Data taken from the same Area
Proc. 15th Int. Congr. on Electron Microscopy ICEM15, Durban, South Africa, Vol. 3 (2002) 209 – 210 - M. Lehmann, K. Brand, H. Lichte
Holographic Setup for 2D-Dopant Profiling using the Lorentz-Lens
Microsc. Microanal. 8 (Suppl 2: Proceedings), Quebec (2002) 536CD – 537CD - M. Lehmann, H. Lichte
Contributions of Elastically and Inelastically Scattered Electrons to High-Resolution Off-Axis Electron Holograms – a Quantitative Analysis
Microsc. Microanal. 8 (Suppl 2: Proceedings), Quebec (2002) 34 - 35 - H. Lichte, M. Reibold, K. Brand, M. Lehmann
Ferroelectric Electron Holography
Microsc. Microanal. 8 (Suppl 2: Proceedings), Quebec (2002) 538CD – 539CD - H. Lichte, D. Schulze, M. Lehmann, H. Just, T. Erabi, P. Fuerst, J. Goebel, A. Hasenpusch, P. Dietz
The Triebenberg Laboratory - Designed for Highest Resolution Electron Microscopy and Holography
Microsc. Microanal. 7 (Suppl 2: Proceedings), Long Beach (2001) 894 – 895 - K. Brand, Ch. Guo, M. Lehmann, H. Lichte
Quantitative Electron Holography - from the Basis of Dynamical Interaction to Holographic Materials Analysis
Microsc. Microanal. 7 (Suppl 2: Proceedings), Long Beach (2001) 284 – 285 - K. Brand, M. Lehmann, T. Walter, K. Dörr
TEM Investigation of Manganite Thin Films on Different Substrates
Proc. 12th European Congress on Electron Microscopy EUREM 2000, Brno (Czech Republic), Volume II, (2000) P 207 - P 208 - M. Lehmann, T. Walter, K. Dörr
Holographic Studies of Thin Manganite Films
Proc. 12th European Congress on Electron Microscopy EUREM 2000, Brno (Czech Republic), Volume III, (2000) I 67 - I 68 - H. Lichte, M. Lehmann
Off-axis Electron Holography – The Way to Use
Proc. 12th European Congress on Electron Microscopy EUREM 2000, Brno (Czech Republic), Volume III, (2000) I 47 - I 48 - H. Lichte, D. Schulze, M. Lehmann, H. Just, T. Erabi, P. Fürst, J. Göbel, A. Hasenpusch, P. Dietz
The Triebenberg Laboratory – designed for highest resolution electron microscopy and holography
Proc. 12th European Congress on Electron Microscopy EUREM 2000, Brno (Czech Republic), Volume III (2000) I 163 - I 164 - A.C. Twitchett, S.J. Lloyd, M. Lehmann, P.A. Midgley
Two-dimensional mapping of electrostatic potential in a SiC MESFET using electron holography
Proc.12th European Congress on Electron Microscopy EUREM 2000, Brno (Czech Republic), Volume III, (2000) I 73 - I 74 - H. Lichte, D. Schulze, M. Lehmann
Das Triebenberg-Laboratorium für Höchstauflösungselektronenmikroskopie und elektronenoptische Holographie an der Technischen Universität Dresden
Wissenschaftliche Zeitschrift der Universität Dresden 49 (2000) Heft 1, 62 - 65 - M. Lehmann:
Determination and correction of coherent wave aberration from off-axis electron holograms by means of a Genetic algorithm
Proceedings of the 14th International Congress on Electron Microscopy ICEM14, Cancun (Mexico), Volume I, (1998) 557 - 558 - M. Lehmann
Electron holography at atomic dimensions- state of the art in Tübingen
Proceedings of the 11th European Congress on Electron Microscopy EUREM11, Dublin (Ireland), Volume 1, (1996) 386 - 387 - H. Lichte, D. Geiger, A. Harscher, E. Heindl, M. Lehmann, D. Malamidis, A. Orchowski, W.‑D. Rau
Artefacts in electron holography
Proceedings of the 11th European Congress on Electron Microscopy EUREM11, Dublin (Ireland), Volume 1, (1996) 402 - 403 - E. Völkl, L.F. Allard, T.A. Nolan, D. Hill, M. Lehmann
A simple and inexpensive route to remote electron microscopy
Conf. Proc. Microscopy and Microanalysis (1996) - M. Lehmann, H. Lichte
Interactive computerbased holographic correction of aberrations
13th International Congress on Electron Microscopy, ICEM13, Paris, (1994) 293 - 294 - M. Lehmann, F. Lenz, E. Völkl, H. Lichte
A fast alternative algorithm for the reconstruction of electron off-axis holograms
10th European Congress on Electron Microscopy, EUREM92, Granada, Last Minute Brochure (1992) 21 - 22
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Prof. Dr. Michael Lehmann
+49 (0)30-314 22567
Ernst-Ruska-Gebäude
Raum ER 292
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+49 (0)30-314 22567
Ernst-Ruska-Gebäude
Raum ER 292
E-Mail-Anfrage
Webseite