Inhalt des Dokuments
Influence of waveguide strain and surface morphology on AlGaN-based deep UV laser characteristics
Christian Kuhn, Martin Martens, Frank Mehnke, Johannes Enslin, Peter Schneider, Christoph Reich, Felix Krueger, Jens Rass, Jae Bum Park, Viola Kueller, Arne Knauer, Tim Wernicke, Markus Weyers, Michael Kneissl,
Influence of waveguide strain and surface morphology on AlGaN-based deep UV laser characteristics
Journal of Physics D: Applied Physics 51 (2018) 415101
Three-Dimensional Composition and Electric Potential Mapping of III-V Core-Multishell Nanowires by Correlative STEM and Holographic Tomography
D. Wolf, R. Hubner, T. Niermann, S. Sturm, P. Prete, N. Lovergine, B. Buchner, A. Lubk
Three-Dimensional Composition and Electric Potential Mapping of III-V Core-Multishell Nanowires by Correlative STEM and Holographic Tomography
Nano Letters 18, 4777-4784 (2018)
Accurate determination of polarization fields in (0001) c-plane InAlN/GaN heterostructures with capacitance-voltage-measurements
Norman Susilo, Georgios G Roumeliotis, Michael Narodovitch, Bernd Witzigmann, Monir Rychetsky, Silvio Neugebauer, Martin Guttmann, Johannes Enslin, Armin Dadgar, Tore Niermann, Tim Wernicke, André Strittmatter, Michael Lehmann, Dimitra N Papadimitriou, and Michael Kneissl
Accurate determination of polarization fields in (0001) c-plane InAlN/GaN heterostructures with capacitance-voltage-measurements
J. Phys. D: Appl. Phys. 51 (2018) 485103 (5pp)
Zusatzinformationen / Extras
Direktzugang
Hilfsfunktionen
+49 (0)30-314 22567
Ernst-Ruska-Gebäude
Raum ER 292
E-Mail-Anfrage
Webseite