FEI Titan 80-300 Berlin Holography Special TEM

This excellent high-performance transmission electron microscope (TEM) with atomic resolution is specially electron-optically optimized for electron holography. It provides

• first Titan X-Lens world-wide for electron holography
• high-brightness electron gun
• 2 Möllenstedt biprisms
• Lorentz-lens
• image Cs-corrector
• 75 pm information limit @ 300 kV acceleration voltage
• TrueImage focal series reconstruction
• operating at 80 kV and 300 kV acceleration voltage.

The instrument was funded within a mutual project of German Research Foundation (DFG), TU Berlin, and FEI Company.