Hitachi SU8030 SEM

The Hitachi high-resolution scanning electron microscope (SEM) is the ultimate instrument for surface analysis. It bridges the gap between conventional SEMs and TEMs with its excellent specification:

• 1 nm ultra high-resolution SEM
• cold field emitter
• triple-detection-system with ExB filter
• STEM and EDX detectors
• low kV and deceleration function
• 3step antikontamination.

This state-of-the-art instrument is operated by ZELMI.

The microscope is financed by the German Research Foundation (DFG) and various working groups.